发明名称 ORIENTATION FLAT POSITION DETERMINATION METHOD AND ORIENTATION FLAT POSITION DETERMINATION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an orientation flat position determination method and an orientation flat position determination device that can easily and securely determine an orientation flat position.SOLUTION: There is provided an orientation flat position determination method for sapphire crystal, the orientation flat position determination method including the steps of: making X rays incident on a side face of columnar sapphire crystal including a "c" axis as its center axis; detecting generating diffracted rays and specifying the position of a crystal plane of the sapphire crystal which is symmetrical by three rotations on the "c" axis and the position of an "a" plane so as to specify a "-a" plane; and determining the specified position of the "-a" plane as an orientation flat position. The crystal plane which is symmetrical by three rotations on the "c" axis is thus used to discriminate between a "+a" plane and the "-a" plane with respect to the "a" plane as a crystal plane of symmetry by six rotations, and the orientation flat position specified with the "-a" plane can be easily and securely determined.
申请公布号 JP2014048160(A) 申请公布日期 2014.03.17
申请号 JP20120191348 申请日期 2012.08.31
申请人 RIGAKU CORP 发明人 KIKUCHI TETSUO
分类号 G01N23/207;C30B29/20;C30B33/00 主分类号 G01N23/207
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