发明名称 Method for forming Ni film
摘要 A method for the formation of an Ni film is herein disclosed, which comprises the steps of maintaining the temperature of an Si substrate at a desired level in a vacuum chamber; introducing, into the vacuum chamber, a nickel alkylamidinate (in this organometal compound, the alkyl group is a member selected from the group consisting of a methyl group, an ethyl group, a butyl group and a propyl group), H2 gas and NH3 gas; and then forming an Ni film according to the CVD technique, wherein the film-forming temperature is set at a level between higher than 280� C. and not higher than 350� C.
申请公布号 US8669191(B2) 申请公布日期 2014.03.11
申请号 US201213445450 申请日期 2012.04.12
申请人 UEHIGASHI TOSHIMITSU;HIGUCHI YASUSHI;ISHIKAWA MICHIO;USHIKAWA HARUNORI;HANADA NAOKI;ULVAC, INC. 发明人 UEHIGASHI TOSHIMITSU;HIGUCHI YASUSHI;ISHIKAWA MICHIO;USHIKAWA HARUNORI;HANADA NAOKI
分类号 H01L21/31;H01L21/469 主分类号 H01L21/31
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