发明名称 SYSTEM AND METHOD FOR A FIELD-EFFECT TRANSISTOR WITH A RAISED DRAIN STRUCTURE
摘要 A method for forming a field-effect transistor with a raised drain structure is disclosed. The method includes forming a frustoconical source by etching a semiconductor substrate, the frustoconical source protruding above a planar surface of the semiconductor substrate; forming a transistor gate, a first portion of the transistor gate surrounding a portion of the frustoconical source and a second portion of the gate configured to couple to a first electrical contact; and forming a drain having a raised portion configured to couple to a second electrical contact and located at a same level above the planar surface of the semiconductor substrate as the second portion of the transistor gate. A semiconductor device having a raised drain structure is also disclosed.
申请公布号 US2014061775(A1) 申请公布日期 2014.03.06
申请号 US201213599642 申请日期 2012.08.30
申请人 CHUANG HAK-LAY;ZHU MING;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHUANG HAK-LAY;ZHU MING
分类号 H01L29/78;H01L21/336;H01L27/092 主分类号 H01L29/78
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