| 摘要 |
<p>A method of diagnosing an integrated circuit device (20) having a plurality of combinational circuits (11, 12, 8) at least one input memory circuit (F/F11, F/F31, F/F32, F/F13, F/F23, F/F33) connected to an input side of the combinational circuits, and an output memory circuit (F/F23, F/F25, F/F33) connected to an output side of the combinational circuits is disclosed in which an input diagnostic signal is selectively applied to at least one input memory circuit (F/F11, F/F31) connected to a given one (11) of the combinational circuits, to read out a diagnostic signal stored in an output memory circuit (FIF23) connected to the given combinational circuit (11). Further, an integrated circuit device is disclosed which is suited to be diagnosed in the above method.</p> |
