发明名称 System and method of ion beam source for semiconductor ion implantation
摘要 An apparatus comprises an ionization chamber for providing ions during a process of ion implantation, and an electron beam source device inside the ionization chamber. The electron beam source device comprises a field emission array having a plurality of emitters for generating electrons in vacuum under an electric field.
申请公布号 US8664622(B2) 申请公布日期 2014.03.04
申请号 US201213443994 申请日期 2012.04.11
申请人 HWANG CHIH-HONG;CHANG CHUN-LIN;YANG CHI-MING;LIN CHIN-HSIANG;KU WEN-YU;TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 HWANG CHIH-HONG;CHANG CHUN-LIN;YANG CHI-MING;LIN CHIN-HSIANG;KU WEN-YU
分类号 H01J27/00;A61N5/00;G21G5/00 主分类号 H01J27/00
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