发明名称 MASK RESIDUE REMOVAL FOR SUBSTRATE DICING BY LASER AND PLASMA ETCH
摘要 Methods of dicing substrates having a plurality of ICs. A method includes forming a mask and patterning the mask with a femtosecond laser scribing process to provide a patterned mask with gaps. The patterning exposes regions of the substrate between the ICs. The substrate is etched through the gaps in the patterned mask to singulate the IC. The mask is removed and metallized bumps on the diced substrate are contacted with an inorganic acid solution to remove mask residues.
申请公布号 US2014057414(A1) 申请公布日期 2014.02.27
申请号 US201313973642 申请日期 2013.08.22
申请人 IYER APARNA;LEI WEI-SHENG;EATON BRAD;KUMAR AJAY 发明人 IYER APARNA;LEI WEI-SHENG;EATON BRAD;KUMAR AJAY
分类号 H01L21/78;B23K26/38 主分类号 H01L21/78
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