发明名称 Method and Apparatus for Inspecting Substrate with High Efficiency Reflection and Transmission and Phase Shift of Transmission Light
摘要 A method and an apparatus for inspecting a substrate by using high reflection and transmission efficiency and retardation of transmission light are provided to perform inspection by performing retardation of transmission light like a function of LC after attachment previously before the attachment, thereby performing inspecting under environment similar to environment after attachment when inspecting the substrate before attachment. A polarizing unit(133) for passing through light of a specific vibration direction, a retardation unit(134) for generating retardation of two vibration direction components of light, and a magic mirror(135) having predetermined light reflectivity and transmittance are sequentially contacted. A substrate(123) is placed on the magic mirror. Light is radiated from a lower part of the polarizing unit. By the light radiated from the lower part of the polarizing unit, light(138) transmitted after passing through the substrate is inspected.
申请公布号 KR101367922(B1) 申请公布日期 2014.02.27
申请号 KR20070036885 申请日期 2007.04.16
申请人 发明人
分类号 G02F1/13 主分类号 G02F1/13
代理机构 代理人
主权项
地址
您可能感兴趣的专利