发明名称 SEMICONDUCTOR DEVICE HAVING METAL PLUG AND METHOD OF MANUFACTURING THE SAME
摘要 A semiconductor device includes a first insulating layer on a substrate; a first contact hole passing through the first insulating layer and exposing an upper surface of the substrate; a first barrier metal layer disposed on a sidewall and at a bottom of the first contact hole and a first metal plug disposed on the first barrier metal layer and in the first contact hole. A recess region is between the first insulating layer and the first metal plug. A gap-fill layer fills the recess region; and a second insulating layer is on the gap-fill layer. A second contact hole passes through the second insulating layer and exposes the upper surface of the first metal plug. A second barrier metal layer is on a sidewall and at the bottom of the second contact hole; and a second metal plug is on the second barrier metal layer.
申请公布号 US2014048939(A1) 申请公布日期 2014.02.20
申请号 US201313796195 申请日期 2013.03.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK SANGJINE;YOON BOUN;HAN JEONGNAM;KWON KEE-SANG;CHOI WONSANG
分类号 H01L23/532;H01L21/768 主分类号 H01L23/532
代理机构 代理人
主权项
地址