发明名称 ACTINIC RAY SENSITIVE OR RADIATION SENSITIVE RESIN COMPOSITION, ACTINIC RAY SENSITIVE OR RADIATION SENSITIVE FILM USING THE SAME, METHOD FOR FORMING PATTERN, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an actinic ray sensitive or radiation sensitive resin composition that not only can simultaneously satisfy high sensitivity, high resolution, favorable pattern shape, favorable line edge roughness and favorable exposure latitude (EL) at high levels but also can achieve satisfactorily favorable outgassing performance during exposure.SOLUTION: The actinic ray sensitive or radiation sensitive resin composition includes a resin (P) comprising any of repeating units (A) of general formula (I) below, each of which contains an ionic structural moiety that when irradiated with actinic rays or radiation, is decomposed to thereby generate an acid in a side chain of the resin, where Arrepresents a bivalent aromatic ring group and Xrepresents a single bond, -O-, -S-, -C(=O)-, -S(=O)-, -S(=O)- or a methylene group which may have a substituent.
申请公布号 JP2014029481(A) 申请公布日期 2014.02.13
申请号 JP20130112307 申请日期 2013.05.28
申请人 FUJIFILM CORP 发明人 KAWABATA KENJI;TSUBAKI HIDEAKI;TAKIZAWA HIROO;YOKOGAWA NATSUMI
分类号 G03F7/004;C08F12/14;C08F212/14;G03F7/038;G03F7/039;H01L21/027 主分类号 G03F7/004
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