发明名称 METHODS AND APPARATUSES FOR DETERMINING RESELECTION PARAMETERS FOR DETECTED CELLS
摘要 The present disclosure presents a method and apparatus for determining reselection parameters for detected cells. For example, the method may include receiving system information block (SIB) data associated with one or more cells in a neighbor cell list (NCL). In such example, the SIB data may include a ranking offset parameter associated with each of the NCL cells. Furthermore, such an example method may include detecting a cell that is not in the NCL, determining a reselection ranking value associated with each of the NCL cells, the detected cell and the serving cell. In addition, in some examples, such method may include ranking the one or more NCL cells, the detected cell and the serving cell in a ranking list based on the reselection ranking values. As such, reselection parameters for detected cells may be determined.
申请公布号 WO2014022718(A2) 申请公布日期 2014.02.06
申请号 WO2013US53309 申请日期 2013.08.01
申请人 QUALCOMM INCORPORATED 发明人 WANG, FAN;HU, AN-SWOL CLEMENT;KAILASAM, SUNDARESAN TAMBARAM;KHAN, UZMA
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