发明名称 Manufacturing method of semiconductor device
摘要 An object is to provide a manufacturing method of a semiconductor device having a high field effect mobility and including an oxide semiconductor layer in a semiconductor device including an oxide semiconductor. Another object is to provide a manufacturing method of a semiconductor device capable of high speed operation. An oxide semiconductor layer is terminated by a halogen element, and thus an increase in the contact resistance between the oxide semiconductor layer and a conductive layer in contact with the oxide semiconductor layer is suppressed. Therefore, the contact resistance between the oxide semiconductor layer and the conductive layer becomes favorable and a transistor having a high field effect mobility can be manufactured.
申请公布号 US8642380(B2) 申请公布日期 2014.02.04
申请号 US201113165963 申请日期 2011.06.22
申请人 NODA KOSEI;SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 NODA KOSEI
分类号 H01L21/336 主分类号 H01L21/336
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