发明名称 Scanning electron microscope and a method for imaging a specimen using the same
摘要 (1) part or all of the number, coordinates and size/shape and imaging sequence of imaging points each for observation, the imaging position change method and imaging conditions can be calculated automatically from CAD data, (2) a combination of input information and output information for imaging recipe creation can be set arbitrarily, and (3) decision is made of imaging or processing at an arbitrary imaging point as to whether to be successful/unsuccessful and in case a failure is determined, a relief process can be conducted in which the imaging point or imaging sequence is changed.
申请公布号 US8642957(B2) 申请公布日期 2014.02.04
申请号 US201213432176 申请日期 2012.03.28
申请人 MIYAMOTO ATSUSHI;NAGATOMO WATARU;MATSUOKA RYOICHI;MOROKUMA HIDETOSHI;HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 MIYAMOTO ATSUSHI;NAGATOMO WATARU;MATSUOKA RYOICHI;MOROKUMA HIDETOSHI
分类号 G01N23/00 主分类号 G01N23/00
代理机构 代理人
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