发明名称
摘要 <p>The invention relates to a method for detecting arcs in a direct-current path of a photovoltaic system, wherein values of a current (IDC) of the direct-current path are detected during a repeating time frame (7) and a mean value (8) is generated, and such a photovoltaic system. In order to reliably detect arcs by means of a component of the photovoltaic system, values of a voltage (UDC), of the direct-current path are detected during the time frame (7) and a mean value (8, 8') is generated, and at least one detection signal (9) and at least one detection threshold (10) are continuously calculated based on the mean values (8, 8') for the current (IDC) and the voltage (UDC) by means of a calculation method.</p>
申请公布号 JP5393891(B2) 申请公布日期 2014.01.22
申请号 JP20120524046 申请日期 2010.06.02
申请人 发明人
分类号 H01L31/04 主分类号 H01L31/04
代理机构 代理人
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