发明名称 SILICON SINGLE CRYSTAL DOPED WITH GALLIUM, INDIUM, OR ALUMINUM
摘要 <p>A doped silicon single crystal having a resistivity variation along a longitudinal and/or radial axis of less than 10% and a method of preparing one or a sequential series of doped silicon crystals is disclosed. The method includes providing a melt material comprising silicon into a continuous Czochralski crystal growth apparatus, delivering a dopant, such as gallium, indium, or aluminum, to the melt material, providing a seed crystal into the melt material when the melt material is in molten form, and growing a doped silicon single crystal by withdrawing the seed crystal from the melt material. Additional melt material is provided to the apparatus during the growing step. A doping model for calculating the amount of dopant to be delivered into the melt material during one or more doping events, methods for delivering the dopant, and vessels and containers used to deliver the dopant are also disclosed.</p>
申请公布号 EP2611952(A4) 申请公布日期 2014.01.22
申请号 EP20110822675 申请日期 2011.09.01
申请人 GT ADVANCED CZ LLC 发明人 DELUCA, JOHN, P.;DELK, FRANK, S.;JOHNSON, BAYARD, K.;LUTER, WILLIAM, L.;MIDDENDORF, NEIL, D.;WILLIAMS, DICK, S.;OSTROM, NELS, PATRICK;HIGHFILL, JAMES, N.
分类号 C30B15/04;C30B15/00;C30B29/06;H01L31/042 主分类号 C30B15/04
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