发明名称 SOLUTION FOR REMOVAL OF RESIDUE AFTER SEMICONDUCTOR DRY PROCESSING AND RESIDUE REMOVAL METHOD USING SAME
摘要 A residue-removing solution for removing residues after a dry process, which includes an amine salt of a monocarboxylic acid and/or a salt of a polycarboxylic acid that forms a 7- or more-membered ring chelate with copper, and water, the residue-removing solution containing aqueous solution (A) or (B) as described herein. Also disclosed is a method for removing residues present on a semiconductor substrate after dry etching and/or ashing. Further, a method for manufacturing semiconductor devices is further disclosed, which includes subjecting a semiconductor substrate having Cu as an interconnect material, and a low dielectric constant film as an interlayer dielectric material, to dry etching and/or ashing; and bringing the processed semiconductor substrate into contact with the above residue-removing solution.
申请公布号 KR101354419(B1) 申请公布日期 2014.01.22
申请号 KR20117006795 申请日期 2009.08.04
申请人 发明人
分类号 G03F7/42;H01L21/027;H01L21/304 主分类号 G03F7/42
代理机构 代理人
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