发明名称 SHAPE-MEASURING DEVICE, SYSTEM FOR MANUFACTURING STRUCTURE, SHAPE-MEASURING METHOD, METHOD FOR MANUFACTURING STRUCTURE AND SHAPE-MEASURING PROGRAM
摘要 PROBLEM TO BE SOLVED: To reduce the degree of lowering in accuracy of shape measurement.SOLUTION: A shape-measuring device includes: a light-projecting part for projecting light flux having some intensity distribution to a measuring object; a control part for controlling coherency of the light flux on the basis of information to be inputted; an imaging part for generating a picked-up image obtained by imaging the surface of the measuring object on which the light flux is projected; and a measurement part for measuring a shape of the surface on the basis of a position of the light flux contained in the picked-up image generated by the imaging part.
申请公布号 JP2014006149(A) 申请公布日期 2014.01.16
申请号 JP20120141934 申请日期 2012.06.25
申请人 NIKON CORP 发明人 NAKAJIMA YASUHARU
分类号 G01B11/24 主分类号 G01B11/24
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