发明名称 |
Exclusion zone for stress-sensitive circuit design |
摘要 |
A semiconductor structure less affected by stress and a method for forming the same are provided. The semiconductor structure includes a semiconductor chip. Stress-sensitive circuits are substantially excluded out of an exclusion zone to reduce the effects of the stress to the stress-sensitive circuits. The stress-sensitive circuits include analog circuits. The exclusion zone preferably includes corner regions of the semiconductor chip, wherein the corner regions preferably have a diagonal length of less than about one percent of the diagonal length of the semiconductor chip. The stress-sensitive analog circuits preferably include devices having channel lengths less than about five times the minimum channel length. |
申请公布号 |
US8624346(B2) |
申请公布日期 |
2014.01.07 |
申请号 |
US20060324967 |
申请日期 |
2006.01.03 |
申请人 |
SU CHAO-YUAN;LIN CHUNG-YI;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
SU CHAO-YUAN;LIN CHUNG-YI |
分类号 |
H01L23/29 |
主分类号 |
H01L23/29 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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