发明名称 SYSTEM AND METHOD FOR PREDICTING DEFECTS OF INSTALLING INSULATION USING IMAGE PROCESSING
摘要 The present invention relates to a system and a method for estimating the installation defect of an insulating material using image processing. The system for estimating the installation defect of an insulating material using image processing comprises a terminal for photographing and transmitting the image of an insulating material coated with one or more adhesives and receiving and displaying information on the occurrence of an installation defect of the insulating material; and a defect estimating device for finding the area and center of mass of the applied adhesives by analyzing an image transmitted from the terminal, calculating the area and center of mass of the adhesives after compression using the found area and center of mass of the applied adhesives, and estimating the occurrence of a defect after the installation of the insulating material by comparing the calculated area and center of mass of the adhesives after compression with a reference area and a reference center of mass.
申请公布号 KR20140000044(A) 申请公布日期 2014.01.02
申请号 KR20120067319 申请日期 2012.06.22
申请人 KIM, JU HYUNG;LEE, BYEONG SU;CHOI, JANG SHIK;PARK, MIN HO 发明人 KIM, JU HYUNG;LEE, BYEONG SU;CHOI, JANG SHIK;PARK, MIN HO
分类号 G01B11/00;G06T7/60 主分类号 G01B11/00
代理机构 代理人
主权项
地址