发明名称 System and Process for Roof Measurement Using Aerial Imagery
摘要 Processes and systems are disclosed for determining attributes of a roof structure of real-world three-dimensional building(s), including providing computer input field(s) for a user to input location data generally corresponding to the location of the building, providing visual access to a nadir image of a region including the roof structure of the building; on the nadir image of the region, providing a visual marker that is moveable on the computer monitor around the region, the visual marker initially corresponding to the location data but which may be moved to a final location, having location coordinates, on top of the building to more precisely identify the location of the building roof structure; providing a computer input capable of signaling user-acceptance of the final location of the marker; and, providing visual access to one or more oblique images of an aerial imagery database corresponding to location coordinates of the final location.
申请公布号 US2014003707(A1) 申请公布日期 2014.01.02
申请号 US201314018943 申请日期 2013.09.05
申请人 PICTOMETRY INTERNATIONAL CORP. 发明人 THORNBERRY DALE R.;THORNBERRY CHRIS T.;GARRINGER MARK F.
分类号 G06K9/00 主分类号 G06K9/00
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