发明名称 Method and apparatus for breaking semiconductor wafers
摘要 An apparatus and method for breaking a semiconductor wafer along scribe lines to separate individual die. A scribe line of the wafer is aligned with a straight, elongated pyramid-shaped edge of a precision bending bar, and a compressive force is applied to the surface of the wafer by a compressive member to bend the wafer over the edge and break the wafer along the scribe line.
申请公布号 US7262115(B2) 申请公布日期 2007.08.28
申请号 US20050213015 申请日期 2005.08.26
申请人 DYNATEX INTERNATIONAL 发明人 BAYLIS WILLIAM H.;TYLER JOHN E.
分类号 H01L21/301 主分类号 H01L21/301
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