| 摘要 |
PROBLEM TO BE SOLVED: To provide a microscope system that includes a configuration allowing position information to be acquired with accuracy of a microscope level.SOLUTION: A microscope system comprises: a microscope main body; and an X-Y stage that has a stage loading a slide of an observation object and moving in mutually orthogonal X-axis direction and Y-axis direction, and is mounted to the microscope main body; and an X-Y scale plate that is anchored to the stage. In the X-Y stage plate, provided are: a first mark that presents axis information on an X-axis direction over a movement range in a Y-axis direction of the stage for recognizing an X-Y coordinate of the stage; and a second mark that presents axis information on the Y-axis direction over a movement range in the X-direction of the stage therefor.SELECTED DRAWING: Figure 3 |
