发明名称 Integrated circuit system with test pads and method of manufacture thereof
摘要 A method of manufacture of an integrated circuit system includes: providing a substrate having a test pad with element pads; forming a conductive layer over the test pad, the conductive layer having element layers directly on the element pads; and mounting an integrated circuit over the substrate.
申请公布号 US8614508(B2) 申请公布日期 2013.12.24
申请号 US201113239373 申请日期 2011.09.21
申请人 XUSHENG BAO;HUANG RUI;STATS CHIPPAC LTD. 发明人 XUSHENG BAO;HUANG RUI
分类号 H01L29/40 主分类号 H01L29/40
代理机构 代理人
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