<p>The present invention provides a method for automatically testing the performance of a device under test (DUT) in an unmanned automation test system. The present invention comprises a step for, when an electromagnetic pulse for testing the electrostatic discharge (ESD) of the DUT is applied, determining whether or not a test result is successful or unsuccessful and a step for detecting at least one failure type and converting the state of the DUT into a normal state by controlling the functions of the DUT with an algorithm determined according to the detected failure type when the test result is unsuccessful. The present invention classifies various malfunction types when an ESD test is performed and facilitates the unmanned automation test by converting the state of the DUT into the normal state according to the malfunction types. [Reference numerals] (110) ESD test device;(120) Light detector;(130) Microphone detector;(140) Power supply device;(150) Call station;(160) Jig box;(AA) Probe</p>
申请公布号
KR20130138041(A)
申请公布日期
2013.12.18
申请号
KR20120061826
申请日期
2012.06.08
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
LEE, HAN AWL;LEE, JAE KYU;CHOI, WOONG HAE;LEE, BYOUNG HEE