发明名称 MEASURING A CRYSTAL GROWTH FEATURE USING MULTIPLE CAMERAS
摘要 Three-dimensional measurement of a crystal being pulled from a crucible is described. A first camera captures a first image of the crystal on a first image plane and a second camera captures a second image of the crystal on a second image plane. A mathematical model of a crystal during crystal growth is generated. The model includes a plurality of model sample points. A crystal growth feature is detected within the first image and the second image. A first error value is determined by comparing the model to the at least one crystal growth feature within the first image and a second error value is determined by comparing the model to the at least one crystal growth feature within the second image. An estimated 3-D metrology value associated with the at least one crystal growth feature is generated by adjusting the mathematical model to minimize the determined first error value and the determined second error value.
申请公布号 KR20130133261(A) 申请公布日期 2013.12.06
申请号 KR20137020072 申请日期 2011.12.28
申请人 MEMC ELECTRONIC MATERIALS, INC. 发明人 KIMBEL STEVEN L.;FUERHOFF ROBERT H.
分类号 C30B15/26;C30B15/20 主分类号 C30B15/26
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