发明名称 |
Reduced-pain allergy skin test device |
摘要 |
An allergy skin test device is disclosed that causes less pain than commonly used devices that include multi-point sharp puncture heads. The allergy skin test device incorporates multiple dull pressure heads distributed amongst the sharp multi-point sharp puncture heads, each dull pressure head activating a neurological pain gate that reduces pain sensation typically caused by the neighboring multi-point head when it engages the skin. |
申请公布号 |
US8597199(B2) |
申请公布日期 |
2013.12.03 |
申请号 |
US20100902030 |
申请日期 |
2010.10.11 |
申请人 |
HARISH ZIV;RUBINSTEIN ISAAC;ARBIT EHUD;WEINZIMMER RUSS |
发明人 |
HARISH ZIV;RUBINSTEIN ISAAC;ARBIT EHUD;WEINZIMMER RUSS |
分类号 |
A61B5/00 |
主分类号 |
A61B5/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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