发明名称 Reliability Measuring Apparatus for Light Emitting Diode
摘要 PURPOSE: A device for evaluating the reliability of a light emitting diode is provided to reduce errors of characteristic data of the light emitting diode and to prevent the characteristic transformation of a light receiving module. CONSTITUTION: A chamber (200) heats or cools a light emitting diode for measuring a temperature characteristic of a light emitting diode. A measurement unit (300) is included in the outside of the chamber and measures an optical or electrical characteristic of the light emitting diode. A stage (400) moves the light emitting diode from the measurement unit to a chamber or from the chamber to the measurement unit. A power supply unit (500) supplies power to the light emitting diode. A data storage unit (600) stores optical or electrical data measured in the measurement unit. A control unit (700) controls the chamber, the measurement unit, the stage, or the power supply unit and stores the optical or electrical data in the data storage unit. [Reference numerals] (210,220) Heater or cooler; (230) Temperature measuring unit; (310) Light receiving transferring device; (320) Light receiving module; (330) Spectrometer; (400) Stage; (500) Power supply unit; (600) Storage unit; (700) Control unit
申请公布号 KR101335604(B1) 申请公布日期 2013.12.02
申请号 KR20120032317 申请日期 2012.03.29
申请人 发明人
分类号 G01J1/02;G01M11/02;G01R31/26 主分类号 G01J1/02
代理机构 代理人
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