发明名称
摘要 After the plurality of single-crystal semiconductor layers are provided adjacent to each other with a certain distance over a glass substrate which is a support substrate, heat treatment is performed on the glass substrate. The support substrate shrinks by this heat treatment, and the adjacent single-crystal semiconductor layers are in contact with each other due to the shrink. Energy beam irradiation is performed with the plurality of single-crystal semiconductor layers being in contact with each other, the plurality of single-crystal semiconductor layers are integrated, and thus a continuous single-crystal semiconductor layer is formed.
申请公布号 JP5348926(B2) 申请公布日期 2013.11.20
申请号 JP20080102308 申请日期 2008.04.10
申请人 发明人
分类号 H01L21/02;H01L27/12 主分类号 H01L21/02
代理机构 代理人
主权项
地址