Portable x-ray diffractometer

摘要

The invention is an X-ray diffractometer (1) suited to determine the residual stresses in polycrystalline materials subjected to analysis, comprising: a supporting structure (2) in which it is possible to identify a curved guide (3) essentially in the shape of an arc of a circle, along which a supporting carriage (4) is slidingly coupled; a driving unit (5) that sets the supporting carriage (4) moving along the curved guide (3); an X-ray source unit (6) and a detector unit (7), connected to the supporting carriage (4) for their rotation with respect to the point at the height of which said sample is positioned. In the X-ray diffractometer the driving unit (5) comprises: a driving bar (8) essentially arranged between the opposite ends (31, 32) of a chord of the curved guide (3) and defining a longitudinal axis (x) that lies on a plane (À) essentially parallel to the plane (Á) defined by the same curved guide (3); a drive element (9) movable along the driving bar (8) and operatively associated with the supporting carriage (4) through articulation means (10) so as to allow the linear motion of the drive element (9) to be transformed in the curved motion of the supporting carriage (4); power means (11) associated with a first end of the driving bar (8) to set the drive element (9) moving according to the longitudinal axis (x).