发明名称 CONTACT PIN, AND THE SOCKET FOR TEST OF SEMICONDUCTOR PACKAGE COMPRISING THE SAME
摘要 The present invention provides a multi-contact contact pin for a semiconductor package socket and a socket for mounting a semiconductor package including the same. The multi-contact contact pin for a semiconductor package socket comprises a triangular contact part which is mounted in a semiconductor package socket and makes an interface with a semiconductor package terminal; an upper terminal which consists of contact units composed of support plates extended to the lower part of the contact part and is connected by a bent part to make the contact units compose the side of a triangular pillar; an elastic part which is extended to the lower end of one contact unit and to the lower part; and a pin leg part which is extended from one lower side of the elastic part to the lower part. [Reference numerals] (AA) Front view;(BB) Rear view
申请公布号 KR20130124824(A) 申请公布日期 2013.11.15
申请号 KR20120048253 申请日期 2012.05.07
申请人 OKINS ELECTRONICS CO., LTD. 发明人 JUN, JIN GUK;PARK, SUNG KYU;JEONG, BYEONG WON
分类号 G01R31/26;G01R1/067;G01R31/28 主分类号 G01R31/26
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