发明名称 BONDING APPARATUS
摘要 PROBLEM TO BE SOLVED: To appropriately and efficiently perform bond between substrates, while suppressing occurrence of voids between the substrates.SOLUTION: A conveyance region T1 and a processing region T2 are formed in a bonding apparatus 41. The conveyance region T1 comprises: a wafer conveying body 82 for conveying wafers Wand W, and a superposed wafer W; a position adjustment mechanism 90 for adjusting orientation of a horizontal direction of the wafers Wand W; and an inverting mechanism 130 for inverting front and rear surfaces of the upper wafer W. The processing region T2 comprises: a lower chuck 100 for placing the lower wafer Won an upper surface for holding; an upper chuck 101 for holding the upper wafer Won a lower surface; and a pressing member 120 for allowing one place of the lower wafer Wto abut on one place of the upper wafer Wfor pressing when the wafers Wand Ware bonded.
申请公布号 JP2013232685(A) 申请公布日期 2013.11.14
申请号 JP20130154753 申请日期 2013.07.25
申请人 TOKYO ELECTRON LTD 发明人 NISHIBAYASHI TAKAHIRO;KITAYAMA MASUNARI;YOSHITAKA NAOTO
分类号 H01L21/02;H01L21/60;H01L21/68;H01L21/683 主分类号 H01L21/02
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