| 摘要 |
A device for sampling surfaces for the presence of compounds is provided, including a housing having a proximal end adapted to receive it negative pressure gradient and a distal end adapted to contact the surfaces; a heating element spaced from the distal end; a primary filter spaced from the heating element; and a secondary filter spaced from the primary filter, the secondary filter removably received by the housing. Also provided is as method for sampling a surface for the presence of compounds, the method including contacting the surface to dislodge the compounds from the surface; capturing first fractions of the compounds with a primary filter while allowing second fractions of the compounds to pass through the primary filter; heating the primary filter to volatilize the first fractions; capturing the volatized first fractions and the second fractions with a secondary filter; and analyzing the secondary filter to identify the compounds.
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