发明名称 METHODS OF MANUFACTURING VERTICAL MEMORY DEVICES
摘要 <p>PURPOSE: A method for manufacturing a vertical memory device is provided to easily perform a semiconductor pattern formation process by extending the inlet of an opening part. CONSTITUTION: An opening part having an expanded inlet is formed. A charge trapping pattern (116a) and an insulating layer pattern (118a) are formed on the sidewall of the opening part. A channel layer is formed in the opening part. The channel layer is electrically connected to a semiconductor substrate. Memory cells and the gate electrodes of a selection transistor are formed on the lateral surface of the channel layer.</p>
申请公布号 KR20130115777(A) 申请公布日期 2013.10.22
申请号 KR20120038403 申请日期 2012.04.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YANG, JUN KYU;NAM, PHIL OUK;SON, YOUNG SEON;HWANG, KI HYUN
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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