<p>PURPOSE: A method for manufacturing a vertical memory device is provided to easily perform a semiconductor pattern formation process by extending the inlet of an opening part. CONSTITUTION: An opening part having an expanded inlet is formed. A charge trapping pattern (116a) and an insulating layer pattern (118a) are formed on the sidewall of the opening part. A channel layer is formed in the opening part. The channel layer is electrically connected to a semiconductor substrate. Memory cells and the gate electrodes of a selection transistor are formed on the lateral surface of the channel layer.</p>
申请公布号
KR20130115777(A)
申请公布日期
2013.10.22
申请号
KR20120038403
申请日期
2012.04.13
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
YANG, JUN KYU;NAM, PHIL OUK;SON, YOUNG SEON;HWANG, KI HYUN