发明名称 WAVEFORM ANALYZING DEVICE AND WAVEFORM ANALYZING METHOD
摘要 PROBLEM TO BE SOLVED: To calculate a value of a normal/abnormal state of an object from sensor data.SOLUTION: A waveform analyzing device is provided which comprises a sensing section 30, a determination section 39 and a calculation section. The sensing section 30 observes a monitoring object by means of a sensor and acquires a plurality of time-series data items about a plurality of variations. The determination section 39 determines a state of the monitoring object. The calculation section calculates a normal or abnormal quantitative state value of the monitoring object. The determination section 39 computes likelihood of normality and likelihood of abnormality of the monitoring object on the basis of segment data and a determination model from the plurality of time-series data items, respectively, and determines a state of the monitoring object to greater likelihood between the likelihood of normality and of abnormality. The calculation section calculates a quantitative state value of normality or abnormality as a sum of adding a result of multiplying a known normal state value by a normality degree and a result of multiplying a known abnormal state value by an abnormality degree.
申请公布号 JP2013210945(A) 申请公布日期 2013.10.10
申请号 JP20120082056 申请日期 2012.03.30
申请人 TOSHIBA CORP;TOSHIBA ELEVATOR CO LTD 发明人 UENO KEN;YONEZAWA MINORU
分类号 G05B23/02;A61B5/00;B66B1/06;B66B1/30;B66B3/00;B66B5/00 主分类号 G05B23/02
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