发明名称 CHARGED PARTICLE BEAM DRAWING DEVICE, PATTERN INSPECTION DEVICE, AND LAYOUT DISPLAY METHOD
摘要 PROBLEM TO BE SOLVED: To make a display speed faster through efficient parallel processes.SOLUTION: A charged particle beam drawing device 1 includes a layer determination section 4a which determines a layer as a unit of parallel processes by comparing an element size in a layer of drawing data of a layer structure having elements by layers with a display object size determined by an enlargement rate, and a parallel process section 4b which performs a series of processes for displaying elements in parallel for each of elements in the layer as the unit of parallel processes determined by the layer determination section 4a.
申请公布号 JP2013211320(A) 申请公布日期 2013.10.10
申请号 JP20120079126 申请日期 2012.03.30
申请人 NUFLARE TECHNOLOGY INC 发明人 YASUI KENICHI
分类号 H01L21/027;G03F1/84 主分类号 H01L21/027
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