发明名称 Target device providing debugging function and test system comprising the same
摘要 A test system for debugging a target device includes a switch unit configured to transfer a test signal to the target device, the target device including a first intellectual property (IP) block supporting a debugging operation at a normal mode and a second IP block supporting a debugging operation at a power saving mode. The switch unit is configured to form a first signal transfer path for transferring the test signal to the first IP block at the normal mode and to form a second signal transfer path for transferring the test signal to the second IP block at the power saving mode.
申请公布号 US8555120(B2) 申请公布日期 2013.10.08
申请号 US201113079992 申请日期 2011.04.05
申请人 AHN HYUNSUN;LEE JAEGON;SAMSUNG ELECTRONICS CO., LTD. 发明人 AHN HYUNSUN;LEE JAEGON
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
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