发明名称 |
Target device providing debugging function and test system comprising the same |
摘要 |
A test system for debugging a target device includes a switch unit configured to transfer a test signal to the target device, the target device including a first intellectual property (IP) block supporting a debugging operation at a normal mode and a second IP block supporting a debugging operation at a power saving mode. The switch unit is configured to form a first signal transfer path for transferring the test signal to the first IP block at the normal mode and to form a second signal transfer path for transferring the test signal to the second IP block at the power saving mode.
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申请公布号 |
US8555120(B2) |
申请公布日期 |
2013.10.08 |
申请号 |
US201113079992 |
申请日期 |
2011.04.05 |
申请人 |
AHN HYUNSUN;LEE JAEGON;SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
AHN HYUNSUN;LEE JAEGON |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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