发明名称 IMAGE INSPECTION METHOD AND IMAGE INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an image inspection method which is capable of more accurately execute quality determination based on a Mahalanobis distance calculated from a feature quantity of an image.SOLUTION: The image inspection method includes: a step of acquiring a plurality of feature quantities with respect to each of a plurality of acquired good quality images and calculating a first parameter and a second parameter for each of the plurality of good quality images; a step of calculating Mahalanobis distances per good quality image on the basis of the first and second parameters and calculating a reference Mahalanobis distance; a step of acquiring a plurality of feature quantities with respect to an acquired image to be inspected, calculating a first parameter and a second parameter for the image to be inspected, and calculating a Mahalanobis distance of the image to be inspected, on the basis of the calculated first and second parameters; and a step of determining the quality of the image to be inspected, on the basis of the Mahalanobis distance of the image to be inspected and the reference Mahalanobis distance.
申请公布号 JP2013200238(A) 申请公布日期 2013.10.03
申请号 JP20120069227 申请日期 2012.03.26
申请人 MITSUBISHI ELECTRIC CORP;MITSUBISHI ELECTRIC METECS CO LTD 发明人 SHIGYO KAZUHIRO;MATSUMOTO TAKASHI;KOBAYASHI HIDEO
分类号 G01N21/88;G01B11/02;G01B11/28;G01N21/892;G06T7/00 主分类号 G01N21/88
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