发明名称 |
IMAGE INSPECTION METHOD AND IMAGE INSPECTION DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide an image inspection method which is capable of more accurately execute quality determination based on a Mahalanobis distance calculated from a feature quantity of an image.SOLUTION: The image inspection method includes: a step of acquiring a plurality of feature quantities with respect to each of a plurality of acquired good quality images and calculating a first parameter and a second parameter for each of the plurality of good quality images; a step of calculating Mahalanobis distances per good quality image on the basis of the first and second parameters and calculating a reference Mahalanobis distance; a step of acquiring a plurality of feature quantities with respect to an acquired image to be inspected, calculating a first parameter and a second parameter for the image to be inspected, and calculating a Mahalanobis distance of the image to be inspected, on the basis of the calculated first and second parameters; and a step of determining the quality of the image to be inspected, on the basis of the Mahalanobis distance of the image to be inspected and the reference Mahalanobis distance. |
申请公布号 |
JP2013200238(A) |
申请公布日期 |
2013.10.03 |
申请号 |
JP20120069227 |
申请日期 |
2012.03.26 |
申请人 |
MITSUBISHI ELECTRIC CORP;MITSUBISHI ELECTRIC METECS CO LTD |
发明人 |
SHIGYO KAZUHIRO;MATSUMOTO TAKASHI;KOBAYASHI HIDEO |
分类号 |
G01N21/88;G01B11/02;G01B11/28;G01N21/892;G06T7/00 |
主分类号 |
G01N21/88 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|