发明名称 METHOD AND DEVICE FOR INSPECTING CELL CULTURE SUBSTRATE AS WELL AS METHOD FOR MANUFACTURING CELL CULTURE SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a method enabling inspection of the condition of a functional layer comprising poly(N-isopropylacrylamide) and the like, which is a temperature responsive polymer, for a short time without requiring performing cell culture.SOLUTION: The present invention is a method for inspecting a cell culture substrate comprising a substrate and a functional layer for cell culture which layer is provided on the substrate, and comprises: a first inspection step of measuring the fall speed of a first droplet supplied to the slanted surface of the functional layer of the cell culture substrate and determining whether the condition of the functional layer is good or not on the basis of the obtained fall speed of the first droplet ;and a second inspection step of supplying a second droplet to the surface of the functional layer, measuring the decrease rate of a contact area in which the second droplet and functional layer contact in the course of the evaporation of the supplied second droplet, and determining whether the condition of the functional layer is good or not on the basis of the obtained decrease rate.
申请公布号 JP2013195399(A) 申请公布日期 2013.09.30
申请号 JP20120066288 申请日期 2012.03.22
申请人 DAINIPPON PRINTING CO LTD 发明人 KURODA MASATOSHI
分类号 G01N33/483;C12M3/00 主分类号 G01N33/483
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