Automatic calibration of a microscope scanning system

摘要

The method involves placing a microscope slide in a microscope slide retainer of a microscope slide frame (4). The microscope slide frame is arranged on a scanning table (10) of a microscope scanning system. The coordinates of a calibration mark are determined based on the detection of the calibration mark of the microscope slide by the microscope scanning system. A deviation between the positioning coordinates of the microscope slide retainer and the mark coordinates of the microscope slide is detected. Independent claims are included for the following: (1) a method for automatic calibration of microscope slide frame; and (2) a microscope slide.