发明名称 CHROMATOGRAPH MASS SPECTROMETER
摘要 After an analysis condition table for measuring each compound is automatically generated in accordance with a compound table, the loop time is calculated for each measurement section for which the overlapping of measurement events differs. If the loop time exceeds a specified value in a given measurement section of a given compound, the event with the earliest end time and the event with the latest start time are extracted from among the overlapping measurement events, and the intermediate time between the end time and the start time is found to adjust the length of each measurement event. By repeating this process, a parameter in the analysis condition table is corrected so that the loop time becomes equal to or less than the specified value.
申请公布号 US2013240727(A1) 申请公布日期 2013.09.19
申请号 US201313890558 申请日期 2013.05.09
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD.;SHIMADZU CORPORATION 发明人 SUMIYOSHI TAKASHI
分类号 H01J49/02 主分类号 H01J49/02
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