发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device, along with its manufacturing method, capable of improving driving ability of a transistor by suppressing a short channel effect to reduce S factor, while suppressing characteristic fluctuations of other elements.SOLUTION: A semiconductor device includes a field effect transistor which contains an active region 16 being divided by an element separation region 14 so as to extend in a first direction, on a main surface of a semiconductor substrate 12, a gate groove 18 which is a groove that traverses the active region 16 so as to divide an upper surface of the active region 16 into two source/drain regions along the first direction, with a cross section of its bottom part, when viewed along the first direction, having a shape containing a portion protruding downward and a portion protruding upward, being continued each other, and a gate electrode 22 which is embedded in the gate groove 18 that is contained in the active region 16 with a gate insulating film 21 in between.
申请公布号 JP2013183154(A) 申请公布日期 2013.09.12
申请号 JP20120048333 申请日期 2012.03.05
申请人 ELPIDA MEMORY INC 发明人 NISHI HIROO;OSHIMA HIROMITSU
分类号 H01L21/8242;H01L21/336;H01L21/76;H01L21/8234;H01L27/088;H01L27/108;H01L29/78 主分类号 H01L21/8242
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