发明名称 SEMICONDUCTOR ELECTROSTATIC PROTECTION CIRCUIT DEVICE
摘要 An electrostatic protection circuit in a semiconductor device includes a first first-conductivity type well extending in a first direction over a semiconductor substrate, a second first-conductivity type well extending in a second direction over the semiconductor substrate and perpendicular to the first direction with one end coupled to a first long side of the first first-conductivity type well, and a second-conductivity type well formed around the first first-conductivity type well and the second first-conductivity type well. It also includes a first high-concentration second-conductivity type region extending in the second direction on a surface of the second first-conductivity type well and a first high-concentration first-conductivity type region extending in the second direction on a surface of the second-conductivity type well while facing the first high-concentration second-conductivity type region.
申请公布号 US2013228824(A1) 申请公布日期 2013.09.05
申请号 US201313781263 申请日期 2013.02.28
申请人 RENESAS ELECTRONICS CORPORATION 发明人 MORISHITA YASUYUKI
分类号 H01L29/74 主分类号 H01L29/74
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