发明名称 X-RAY ANALYZER
摘要 PROBLEM TO BE SOLVED: To provide an X-ray analyzer capable of performing high-efficiency X-ray analysis.SOLUTION: An X-ray analyzer 1 comprises an X-ray source 10, a slit 20, a condenser 30, a holder 40, a detector 50, a scanner 60, a scintillator 70, an imager 80 and a controller 90 and analyzes contained components of a sample S held by the holder 40. The condenser 30 emits from an X-ray emitting terminal an X-ray outputted from the X-ray source 10 and made incident through an opening of the slit 20 to an X-ray incident terminal and converges the X-ray into linear shape that is long in an x direction and short in a y direction. In the case where the sample S is linear, the holder 40 holds the sample S in such a manner that a length direction (x direction) in the case where the X-ray emitted from the X-ray emitting terminal of the condenser 30 is converged into linear shape, is matched with a length direction of the sample S.
申请公布号 JP2013170880(A) 申请公布日期 2013.09.02
申请号 JP20120034030 申请日期 2012.02.20
申请人 HAMAMATSU PHOTONICS KK 发明人 NAKANO TOMOYASU;OBA AKIRA;ONODA SHINOBU;OSUGA SHINJI
分类号 G01N23/223 主分类号 G01N23/223
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