发明名称 MEASUREMENT POINT EXTRACTION PROGRAM, MEASUREMENT POINT EXTRACTION METHOD, AND MEASUREMENT POINT EXTRACTION DEVICE
摘要 PROBLEM TO BE SOLVED: To effectively generate a waveform peak measurement point from waveform-recording data of reflective laser light.SOLUTION: A measurement point extraction method includes: detecting a section from waveform-recording data including information reflecting the waveform of reflection laser light of laser light emitted from a laser distance measurement device to a ground surface, the section in which an amplitude value of a wave form 10 falls after a continuous rising; calculating a length (extension) of line segments 21 through 24 from the minimum value to the maximum values 11 through 14 within the section of the amplitude value of the waveform 10; and extracting the maximum values 11 through 14 and the reciprocating time thereof as a waveform peak measurement point in a case where the extension is equal to or more than a threshold.
申请公布号 JP2013170860(A) 申请公布日期 2013.09.02
申请号 JP20120033555 申请日期 2012.02.20
申请人 PASUKO:KK 发明人 OTSUBO KAZUYUKI
分类号 G01S17/42;G01C3/06;G01S17/89 主分类号 G01S17/42
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