发明名称 DEFECT EXTRACTION APPARATUS AND DEFECT EXTRACTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a defect extraction apparatus and a defect extraction method capable of accurately extracting a defect even when a measuring object is casting.SOLUTION: Measurement point data including three-dimensional position information of many measurement points corresponding to a shape of a measuring object are acquired (S10). A separation/alignment routine for all points for separating all the measurement points into a working plane point group and a point group other than the working plane point group and aligning each separated point group is performed (S14). Then, a defect determination routine for calculating a distance between three-dimensional corresponding points, extracting a first error corresponding area, calculating a distance between two-dimensional points, extracting a second error corresponding area from the first error corresponding area, and comparing a feature value of the second error corresponding area with a set value is performed (S15) to determine whether the second error corresponding area is a defect or not.
申请公布号 JP2013167445(A) 申请公布日期 2013.08.29
申请号 JP20120029012 申请日期 2012.02.14
申请人 AISIN SEIKI CO LTD 发明人 TODA MASATAKA
分类号 G01B11/30;G01B11/00;G01B11/24 主分类号 G01B11/30
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