发明名称 |
TWO-STEP WET TEXTURING PRODUCTION METHOD USING METAL ULTRA THIN FILM |
摘要 |
PURPOSE: A texturing method of a silicon wafer is provided to increase the number of electrons by forming an embossing pattern on the surface of a substrate. CONSTITUTION: A primary texturing process is performed (S2). The surface of a silicon wafer is processed by alkali solution. A metal film is formed on the surface of the silicon wafer (S3). A secondary texturing process is performed (S4). The surface of the silicon wafer is process with an acid solution. [Reference numerals] (S1) Si wafer; (S2) Primary texturing(alkali texturing(pyramid structure formation); (S3) Metal film formation; (S4) Secondary texturing(wet texturing); (S5) Nanopattern formation process |
申请公布号 |
KR20130095416(A) |
申请公布日期 |
2013.08.28 |
申请号 |
KR20120016812 |
申请日期 |
2012.02.20 |
申请人 |
KOREA NATIONAL UNIVERSITY OF TRANSPORTATION INDUSTRY-ACADEMIC COOPERATION FOUNDATION |
发明人 |
LIM, DONG GUN;OH, BYOUNG JIN;KIM, KEE SOON;RYU, JEONG SIG |
分类号 |
H01L31/042;H01L21/306;H01L31/0236;H01L31/18 |
主分类号 |
H01L31/042 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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