发明名称 |
Correction of chemical image collected using ATR through germanium hemisphere |
摘要 |
A method and corresponding apparatus provide correction of chemical images collected with a germanium hemisphere ATR microscope. A model is developed for rays passing through a simulated germanium (Ge) hemisphere attenuated total reflection (ATR) microscope. The model determines a data set for rays reaching the detector plane. Movement of the hemisphere is simulated along a first axis between each data set determination. A calculated background spectrum is produced by multiplying the percentage of rays by a background spectrum to produce a calculated background spectrum. A real Ge hemisphere ATR microscope having parameters that substantially match those of the simulated Ge hemisphere microscope is then used to collect a chemical image of a sample that is in contact with the Ge hemisphere. The collected image is then corrected to produce a corrected chemical image.
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申请公布号 |
US8521491(B2) |
申请公布日期 |
2013.08.27 |
申请号 |
US201113084261 |
申请日期 |
2011.04.11 |
申请人 |
DECK FRANCIS J.;NISHIKIDA KOICHI;IZZIA FEDERICO;THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC |
发明人 |
DECK FRANCIS J.;NISHIKIDA KOICHI;IZZIA FEDERICO |
分类号 |
G06G7/48 |
主分类号 |
G06G7/48 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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