发明名称 HIGH BOND LINE THICKNESS FOR SEMICONDUCTOR DEVICES
摘要 Die package for a semiconductor device comprises: (a) a leadframe containing a die attach pad; (b) a conductive layer on a portion of the die attach pad, where the conductive layer has a thickness ranging up to 30 mil; (c) a boundary feature comprising a bond wire partially surrounding the conductive layer, where both ends of the bond wires are attached to the die attach pad; and (d) a die on the conductive layer. Independent claims are included for: (1) a semiconductor device comprising: (a) a leadframe; (b) a conductive layer; (c) a boundary; and (d) a die on the conductive layer; and (2) a method for making a semiconductor device.
申请公布号 KR101293685(B1) 申请公布日期 2013.08.16
申请号 KR20110094018 申请日期 2011.09.19
申请人 发明人
分类号 H01L23/12;H01L23/48 主分类号 H01L23/12
代理机构 代理人
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