| 摘要 |
A solar cell (100) inspection device (1) provided with: a visible light source (11) for emitting visible light; a CCD camera (15) for measuring the reflected image reflected by the anti-reflection film of the solar cell (100); an infrared light source (13) for emitting infrared light onto the solar cell (100); and a CCD camera (16) for measuring the transmitted image transmitted through the solar cell (100). In this inspection device (1), the reflected image and the transmitted image are compared, and regions, from amongst regions representing bright spots in the reflected image, that represent dark spots in the transmitted image are determined to be regions including a particle, and regions, from amongst regions representing bright spots in the reflected image, other than those determined to include a particle are determined to be regions including a pin hole. |
