发明名称 Semiconductor memory device
摘要 In a static memory cell configured using four MOS transistors and two load resistance elements, the MOS transistors are formed on diffusion layers formed on a substrate. The diffusion layers serve as memory nodes. The drain, gate and source of the MOS transistors are arranged in the direction orthogonal to the substrate, and the gate surrounds a columnar semiconductor layer. In addition, the load resistance elements are formed by contact plugs. In this way, it is possible to form a SRAM cell with a small area.
申请公布号 US8507995(B2) 申请公布日期 2013.08.13
申请号 US20100882847 申请日期 2010.09.15
申请人 MASUOKA FUJIO;ARAI SHINTARO;UNISANTIS ELECTRONICS SINGAPORE PTE LTD. 发明人 MASUOKA FUJIO;ARAI SHINTARO
分类号 H01L27/11 主分类号 H01L27/11
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