发明名称 POLYMERIZABLE TERTIARY ESTER COMPOUND, POLYMERIC COMPOUND, RESIST MATERIAL, AND PATTERNING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a polymerizable ester compound useful as a monomer for a base resin of a resist material having a high resolution and a reduced pattern edge roughness in photolithography using a high energy beam such as an ArF excimer laser light as a light source, especially in immersion lithography, and to provide a polymeric compound containing the polymer of the ester compound, a resist material containing the polymeric compound as a base resin, and a patterning method using the resist material.SOLUTION: An objective compound is a polymerizable tertially ester compound represented by general formula (1a) or (1b).
申请公布号 JP2013151592(A) 申请公布日期 2013.08.08
申请号 JP20120012450 申请日期 2012.01.24
申请人 SHIN-ETSU CHEMICAL CO LTD 发明人 SUGA YUKI;HATAKEYAMA JUN;HASEGAWA KOJI
分类号 C08F220/28;G03F7/038;G03F7/039;G03F7/11;G03F7/32;G03F7/38;H01L21/027 主分类号 C08F220/28
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