发明名称 |
POLYMERIZABLE TERTIARY ESTER COMPOUND, POLYMERIC COMPOUND, RESIST MATERIAL, AND PATTERNING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a polymerizable ester compound useful as a monomer for a base resin of a resist material having a high resolution and a reduced pattern edge roughness in photolithography using a high energy beam such as an ArF excimer laser light as a light source, especially in immersion lithography, and to provide a polymeric compound containing the polymer of the ester compound, a resist material containing the polymeric compound as a base resin, and a patterning method using the resist material.SOLUTION: An objective compound is a polymerizable tertially ester compound represented by general formula (1a) or (1b). |
申请公布号 |
JP2013151592(A) |
申请公布日期 |
2013.08.08 |
申请号 |
JP20120012450 |
申请日期 |
2012.01.24 |
申请人 |
SHIN-ETSU CHEMICAL CO LTD |
发明人 |
SUGA YUKI;HATAKEYAMA JUN;HASEGAWA KOJI |
分类号 |
C08F220/28;G03F7/038;G03F7/039;G03F7/11;G03F7/32;G03F7/38;H01L21/027 |
主分类号 |
C08F220/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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